171 search results - page 3 / 35 » Synthesis of Efficient Linear Test Pattern Generators |
137
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VTS
1999
IEEE
15 years 10 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
154
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ITC
1998
IEEE
15 years 10 months ago
1998
IEEE
This paper presents a logic synthesis tool called BETSY (BIST Environment Testable Synthesis) for synthesizing circuits that achieve complete (100%)fault coverage in a user specif...
159
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ICCAD
2002
IEEE
16 years 2 months ago
2002
IEEE
Application-specific instructions can significantly improve the performance, energy, and code size of configurable processors. A common approach used in the design of such instruc...
145
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DELTA
2008
IEEE
16 years 7 days ago
2008
IEEE
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...