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117

GLVLSI
1997
IEEE

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An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation

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An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation

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H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V

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Added	06 Aug 2010
Updated	06 Aug 2010
Type	Conference
Year	1997
Where	GLVLSI
Authors	H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus

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