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168
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VTS
1997
IEEE
15 years 10 months ago
1997
IEEE
We describe a technique to generate critical hazard-free tests for self-timed control circuits build using a macromodule library, in a partial scan based DFT environment. Wepropos...
161
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ENTCS
2007
15 years 6 months ago
2007
In this notes we consider the model of Generative Probabilistic Transition Systems, and Baier and Hermanns’ notion of weak bisimulation defined over them. We prove that, if we ...
236
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ICDIM
2010
IEEE
15 years 4 months ago
2010
IEEE
Data mining aims at extraction of previously unidentified information from large databases. It can be viewed as an automated application of algorithms to discover hidden patterns a...
169
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ICSE
2003
IEEE-ACM
15 years 11 months ago
2003
IEEE-ACM
This paper presents a model checking-based approach to data flow testing. We characterize data flow oriented coverage criteria in temporal logic such that the problem of test ge...
171
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GECCO
2005
Springer
16 years 4 days ago
2005
Springer
The efficient and effective generation of test-data from high-level models is of crucial importance in advanced modern software engineering. Empirical studies have shown that muta...