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This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...

Silvia Chiusano, Fulvio Corno, Paolo Prinetto

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114

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GLVLSI
1997
IEEE

131views VLSI» more GLVLSI 1997»

Analog Circuit Model of Lamprey Unit Pattern Generator

15 years 10 months ago

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Elizabeth J. Brauer, Ranu Jung, Denise M. Wilson, ...

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123

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GLVLSI
1997
IEEE

92views VLSI» more GLVLSI 1997»

An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation

15 years 10 months ago

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H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...

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138

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VTS
1996
IEEE

75views Hardware» more VTS 1996»

A new test pattern generation method for delay fault testing

15 years 10 months ago

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