199
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
Design of efficient System-on-Chips (SoCs) require thorough application analysis to identify various compute intensive parts. These compute intensive parts can be mapped to hardwa...
144
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VLSID
2003
IEEE
2003
IEEE
High Level Modeling and Validation Methodologies for Embedded Systems: Bridging the Productivity Gap
16 years 7 months ago
160
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
Increasing values and spread in leakage current makes it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer ...
174
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
Control dominated embedded systems have to be designed for fast reaction to asynchronous external events occurring in the environment. Such systems must be able to perform signal ...
173
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
In the previous work, the problem of nding gate delays to eliminate glitches has been solved by linear programs (LP) requiring an exponentially large number ofconstraints. By intr...
173
click to vote
VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
We consider the problem of minimizing the delay in transporting a signal across a distance in a VLSI circuit.The problem can be restated as a combined buffer insertion, buffer siz...
172
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
Functional decomposition is a process of splitting a complex circuit into smaller sub-circuits. This paper deals with the problem of determining the set of best free and bound var...
193
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
Abstract-- In battery driven portable applications, the minimization of energy, average power, peak power, and peak power differential are equally important to improve reliability ...
185
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
In this paper, we describe two new algorithms for datapath scheduling which aim at energy reduction while maintaining performance. The proposed algorithms, time constrained and re...
145
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VLSID
2003
IEEE
16 years 7 months ago
2003
IEEE
Cycling induced performance degradation of flash EEPROMs has been reported for VB=0 and VB<0 programming operation. Compared to VB=0, VB<0 programming shows lower interface ...