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MR
2011

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Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process

15 years 22 days ago

Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process

Download www.ics.ee.nctu.edu.tw

Yi-Hsin Weng, Hui-Wen Tsai, Ming-Dou Ker

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262

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MR
2011

351views Robotics» more MR 2011»

Nickel-palladium bond pads for copper wire bonding

15 years 22 days ago

Nickel-palladium bond pads for copper wire bonding

Download www.atotech.com

Horst Clauberg, Petra Backus, Bob Chylak

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