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DDECS
2007
IEEE
121views Hardware» more  DDECS 2007»
16 years 4 days ago
March CRF: an Efficient Test for Complex Read Faults in SRAM Memories
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...
Luigi Dilillo, Bashir M. Al-Hashimi