289 search results - page 47 / 58 » vlsi 2007 |
138
click to vote
VLSID
2007
IEEE
16 years 6 months ago
2007
IEEE
With scaling of CMOS technologies, sub-threshold, gate and reverse biased junction band-to-band-tunneling leakage have increased dramatically. Together they account for more than 2...
213
click to vote
VLSID
2007
IEEE
16 years 6 months ago
2007
IEEE
We present AHIR, an intermediate representation (IR), that acts as a transition layer between software compilation and hardware synthesis. Such a transition layer is intended to t...
159
click to vote
VLSID
2007
IEEE
16 years 6 months ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
132
click to vote
ICCD
2007
IEEE
16 years 2 months ago
2007
IEEE
As the VLSI technology marches beyond 65 and 45nm process technologies, variation in gate length has a direct impact on leakage and performance of CMOS transistors. Due to sub-wav...
127
click to vote
ICCAD
2007
IEEE
16 years 2 months ago
2007
IEEE
—In the VLSI design process, a design implementation often needs to be corrected because of new specifications or design constraint violations. This correction process is referre...