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VLSID
2007
IEEE
92views VLSI» more  VLSID 2007»
16 years 6 months ago
Floorplanning in Modern FPGAs
State-of-the-art FPGA architectures have millions of gates in CLBs, Block RAMs, and Multiplier blocks which can host fairly large designs. While their physical design calls for oor...
Pritha Banerjee, Susmita Sur-Kolay, Arijit Bishnu
VLSID
2007
IEEE
120views VLSI» more  VLSID 2007»
16 years 6 months ago
Interframe Bus Encoding Technique for Low Power Video Compression
This paper proposes a data encoder to reduce switched capacitance on system bus. Our method focuses on transferring raw video data (pixels) between off-chip memory and on-chip mem...
Asral Bahari, Tughrul Arslan, Ahmet T. Erdogan
VLSID
2007
IEEE
160views VLSI» more  VLSID 2007»
16 years 6 months ago
Spectral RTL Test Generation for Microprocessors
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
Nitin Yogi, Vishwani D. Agrawal
VLSID
2007
IEEE
108views VLSI» more  VLSID 2007»
16 years 6 months ago
Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model
Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
Feng Wang 0004, Yuan Xie, R. Rajaraman, Balaji Vai...
VLSID
2007
IEEE
103views VLSI» more  VLSID 2007»
16 years 6 months ago
Impact of Modern Process Technologies on the Electrical Parameters of Interconnects
Abstract-- This paper presents the results obtained from an experimental study of the impact of modern process technologies on the electrical parameters of interconnects. Variation...
Debjit Sinha, Jianfeng Luo, Subramanian Rajagopala...