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174
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ASAP
2005
IEEE
15 years 11 months ago
2005
IEEE
We studied the dynamic instruction count reduction for a single-thread, vectorized and a multi-threaded, non-vectorized, MPEG-4 video encoder. Results indicate a maximum improveme...
146
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CEC
2005
IEEE
15 years 11 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
134
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DATE
2005
IEEE
15 years 11 months ago
2005
IEEE
In this paper, we highlight a fast, effective and practical statistical approach that deals with inter and intra-die variations in VLSI chips. Our methodology is applied to a numb...
146
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DFT
2005
IEEE
15 years 11 months ago
2005
IEEE
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been de...
156
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DFT
2005
IEEE
15 years 11 months ago
2005
IEEE
This paper analyzes the deposition defects in devices and circuits made of Quantum-dot Cellular Automata (QCA) for molecular implementation. Differently from metal-based QCA, in ...