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181
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VTS
2008
IEEE
16 years 1 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
175
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VTS
2008
IEEE
16 years 1 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
205
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VTS
2008
IEEE
16 years 1 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
195
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WCNC
2008
IEEE
16 years 1 months ago
2008
IEEE
—Existing cooperative diversity protocols are designed with the inherent assumption that users exhibit cooperative behavior all the time. However, in a practical cooperative wire...
178
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WCNC
2008
IEEE
16 years 1 months ago
2008
IEEE
—Different types of power-saving techniques have been proposed in various fields to alleviate the limitation on the battery lifetime for the mobile stations (MSs). In order to p...