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196
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
With the advent of multi-processor systems-on-chip, the interest in process migration is again on the rise both in research and in product development. New challenges associated w...
186
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
174
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...
157
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
190
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
This paper proposes a novel HW/SW co-simulation approach that minimizes the impact on software designers. We propose a SystemC-based system that enables the software team to test ...