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171
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...
160
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Stalls, due to mis-matches in communication rates, are a major performance obstacle in pipelined circuits. If the rate of data production is faster than the rate of consumption, t...
165
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
159
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Battery-powered wireless sensors are severely constrained by the amount of the available energy. A method for computing the energy budget per sensing task can be a valuable design...
187
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...