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167
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
Abstract— Gate leakage (direct tunneling current for sub65nm CMOS) can severely affect both the transient and steady state behaviors of CMOS circuits. In this paper we quantify t...
172
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
Abstract— The continuing divergence of processor and memory speeds has led to the increasing reliance on larger caches which have become major consumers of area and power in embe...
159
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
142
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
This paper examines how circuits and systems made from molecular QCA devices might function. Our design constraints are “chemically reasonable” in that we consider the charact...
188
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Efficient communication modeling is a critical task in SoC design and exploration. In particular, fast and accurate communication is needed to predict the performance of a system....