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159
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures. To improve via yield and reliability, redundant-via insertion is a highl...
163
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
Deploying multiple supply voltages (multi-Vdds) on one chip is an important technique to reduce dynamic power consumption. In this work we present an optimality study for resource...
197
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
Most existing dynamic voltage scaling (DVS) schemes for multiple tasks assume an energy cost function (energy consumption versus execution time) that is independent of the task ch...
160
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
155
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
Three-dimensional (3-D) integrated circuits have emerged as promising candidates to overcome the interconnect bottlenecks of nanometer scale designs. While they offer several othe...