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177
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DATE
2005
IEEE
16 years 9 days ago
2005
IEEE
In this paper we present an approach to the design optimization of faulttolerant embedded systems for safety-critical applications. Processes are statically scheduled and communic...
174
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DATE
2005
IEEE
16 years 9 days ago
2005
IEEE
The objective of this paper is to introduce dependability as an optimization criterion in the system-level design process of embedded systems. Given the pervasiveness of embedded ...
174
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DATE
2005
IEEE
16 years 9 days ago
2005
IEEE
In nanometer scaled CMOS devices significant increase in the subthreshold, the gate and the reverse biased junction band-toband-tunneling (BTBT) leakage, results in the large incr...
151
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DATE
2005
IEEE
16 years 9 days ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
172
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DCC
2005
IEEE
16 years 9 days ago
2005
IEEE
In this paper, we address the design of any number of balanced descriptions using multiple description scalar quantization(MDSQ), based on fast index assignment. The proposed sche...