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146
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APSEC
2005
IEEE
16 years 5 days ago
2005
IEEE
Embedded control programs are hard to analyse because their behaviour depends on how they interact with hardware devices. In particular, embedded code typically uses interrupts to...
179
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CITA
2005
IEEE
16 years 5 days ago
2005
IEEE
- We present an architecture for data streams based on structures typically found in web cache hierarchies. The main idea is to build a meta level analyser from a number of levels ...
146
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CRV
2005
IEEE
16 years 5 days ago
2005
IEEE
We present an adaptive filtering based methodology for resampling 3-D time series images using an extension of the method presented by Westin in [11]. We simultaneously reduce th...
155
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DATE
2005
IEEE
16 years 4 days ago
2005
IEEE
Abstract—On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction...
157
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DATE
2005
IEEE
16 years 4 days ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...