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ISSRE
2003
IEEE
15 years 11 months ago
Investigating Java Type Analyses for the Receiver-Classes Testing Criterion
This paper investigates the precision of three linearcomplexity type analyses for Java software: Class Hierarchy Analysis (CHA), Rapid Type Analysis (RTA) and Variable Type Analys...
Pierre-Luc Brunelle, Ettore Merlo, Giuliano Antoni...
ISSRE
2003
IEEE
15 years 11 months ago
Augmenting Simulated Annealing to Build Interaction Test Suites
Component based software development is prone to unexpected interaction faults. The goal is to test as many potential interactions as is feasible within time and budget constraint...
Myra B. Cohen, Charles J. Colbourn, Alan C. H. Lin...
ISSRE
2003
IEEE
15 years 11 months ago
DARX - A Framework For The Fault-Tolerant Support Of Agent Software
This paper presents DARX, our framework for building applications that provide adaptive fault tolerance. It relies on the fact that multi-agent platforms constitute a very strong ...
Olivier Marin, Marin Bertier, Pierre Sens
ITC
2003
IEEE
177views Hardware» more  ITC 2003»
15 years 11 months ago
Analyzing the Effectiveness of Multiple-Detect Test Sets
Multiple-detect test sets have been shown to be effective in lowering defect level. Other researchers have noted that observing the effects of a defect can be controlled by sensit...
R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Aniru...
ITC
2003
IEEE
106views Hardware» more  ITC 2003»
15 years 11 months ago
Detection of Resistive Shorts in Deep Sub-micron Technologies
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
Bram Kruseman, Stefan van den Oetelaar