1840 search results - page 44 / 368 » time 2002 |
165
click to vote
ATS
2002
IEEE
15 years 11 months ago
2002
IEEE
As the deep sub-micron techniques evolving, embedded memories are dominating the yield, while the testing and measurement issues are more difficult due to the access limitations. ...
191
click to vote
DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
153
click to vote
DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
To enable fast and accurate evaluation of HW/SW implementation choices of on-chip communication, we present a method to automatically generate timed OS simulation models. The meth...
175
click to vote
FGR
2002
IEEE
15 years 11 months ago
2002
IEEE
Robust, real-time, fully automatic tracking of facial features is required for many computer vision and graphics applications. In this paper, we describe a fully automatic system ...
149
click to vote
GLVLSI
2002
IEEE
15 years 11 months ago
2002
IEEE
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...