415 search results - page 59 / 83 » time 1994 |
171
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EURODAC
1994
IEEE
15 years 10 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
155
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HICSS
1994
IEEE
15 years 10 months ago
1994
IEEE
We are developing a new problem-solving methodology based on a self-organization paradigm. To realize our future goal of self-organizing computational systems, we have to study co...
148
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ICCAD
1994
IEEE
15 years 10 months ago
1994
IEEE
We propose new techniques for efficient breadth-first iterative manipulation of ROBDDs. Breadth-first iterative ROBDD manipulation can potentially reduce the total elapsed time by...
141
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ICCAD
1994
IEEE
15 years 10 months ago
1994
IEEE
In this paper, we study the simultaneousdriver and wire sizing (SDWS) problem under two objective functions: (i) delay minimization only, or (ii) combined delay and power dissipat...
158
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ICCAD
1994
IEEE
15 years 10 months ago
1994
IEEE
Abstract-- The design of application-specific instruction set processor (ASIP) system includes at least three interdependent tasks: microarchitecture design, instruction set design...