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KBSE
2008
IEEE
16 years 1 months ago
Random Test Run Length and Effectiveness
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
James H. Andrews, Alex Groce, Melissa Weston, Ru-G...
QSIC
2008
IEEE
16 years 1 months ago
Fault Localization with Non-parametric Program Behavior Model
Fault localization is a major activity in software debugging. Many existing statistical fault localization techniques compare feature spectra of successful and failed runs. Some a...
Peifeng Hu, Zhenyu Zhang, Wing Kwong Chan, T. H. T...
ASWEC
2008
IEEE
15 years 8 months ago
Embedding Architectural Practices into Extreme Programming
Today, agile methods become a popular approach to develop software systems. They try to satisfy customer, respond to changes, release in less time and achieve suitable profits for...
Amir Azim Sharifloo, Amir S. Saffarian, Fereidoon ...
ATAL
2008
Springer
15 years 8 months ago
Towards a reliable air traffic control
Since critical socio-technical systems include people interacting with equipments in workplaces, their intrinsic reliability problems have been concerned with both these two "...
Minh Nguyen-Duc, Zahia Guessoum, Olivier Marin, Je...
CASES
2008
ACM
15 years 8 months ago
VESPA: portable, scalable, and flexible FPGA-based vector processors
While soft processors are increasingly common in FPGAbased embedded systems, it remains a challenge to scale their performance. We propose extending soft processor instruction set...
Peter Yiannacouras, J. Gregory Steffan, Jonathan R...