5054 search results - page 821 / 1011 » simulation 2008 |
185
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ISQED
2008
IEEE
16 years 26 days ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
163
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ISQED
2008
IEEE
16 years 26 days ago
2008
IEEE
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay also has variat...
183
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ISVLSI
2008
IEEE
16 years 26 days ago
2008
IEEE
The evolution of deep submicron technologies allows the development of increasingly complex Systems on a Chip (SoC). However, this evolution is rendering less viable some well-est...
186
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ITNG
2008
IEEE
16 years 26 days ago
2008
IEEE
This paper presents several parallel FFT algorithms with different degree of communication overhead for multiprocessors in Network-on-Chip(NoC) environment. Three different method...
170
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IV
2008
IEEE
16 years 26 days ago
2008
IEEE
This paper consists of a review of contemporary that map and materialize abstract data as physical artifacts. With computing technology and the access of information influencing e...