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ISORC
2008
IEEE
16 years 26 days ago
A Flexible Trust Model for Distributed Service Infrastructures
Recent years have witnessed the emergence and rapid growth of distributed service infrastructures such as mobile ad hoc networks, P2P, PlanetLab and Grids. In such distributed inf...
Zhaoyu Liu, Stephen S. Yau, Dichao Peng, Yin Yin
ISPASS
2008
IEEE
16 years 26 days ago
Investigating the TLB Behavior of High-end Scientific Applications on Commodity Microprocessors
The floating point portion of the SPEC CPU suite and the HPC Challenge suite are widely recognized and utilized as benchmarks that represent scientific application behavior. In th...
Collin McCurdy, Alan L. Cox, Jeffrey S. Vetter
ISPW
2008
IEEE
16 years 26 days ago
Accurate Estimates without Calibration?
Most process models calibrate their internal settings using historical data. Collecting this data is expensive, tedious, and often an incomplete process. Is it possible to make acc...
Tim Menzies, Oussama El-Rawas, Barry W. Boehm, Ray...
ISQED
2008
IEEE
151views Hardware» more  ISQED 2008»
16 years 26 days ago
Quality of a Bit (QoB): A New Concept in Dependable SRAM
We propose a novel dependable SRAM with 7T memory cells, and introduce a new concept, “quality of a bit (QoB)” for it. The proposed SRAM has three modes: a typical mode, high-...
Hidehiro Fujiwara, Shunsuke Okumura, Yusuke Iguchi...
ISQED
2008
IEEE
103views Hardware» more  ISQED 2008»
16 years 26 days ago
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
Bin Zhang, Michael Orshansky