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DFT
2008
IEEE
117views VLSI» more  DFT 2008»
16 years 1 months ago
Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS
With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
Vikas Chandra, Robert C. Aitken
DSN
2008
IEEE
16 years 1 months ago
Using likely program invariants to detect hardware errors
In the near future, hardware is expected to become increasingly vulnerable to faults due to continuously decreasing feature size. Software-level symptoms have previously been used...
Swarup Kumar Sahoo, Man-Lap Li, Pradeep Ramachandr...
DSN
2008
IEEE
16 years 1 months ago
Automated duplicate detection for bug tracking systems
Bug tracking systems are important tools that guide the maintenance activities of software developers. The utility of these systems is hampered by an excessive number of duplicate...
Nicholas Jalbert, Westley Weimer
EIT
2008
IEEE
16 years 1 months ago
Defending selective forwarding attacks in WMNs
—Wireless Mesh Networks (WMNs) have emerged recently as a promising technology for next-generation wireless networking to provide wide variety of applications that cannot be supp...
Devu Manikantan Shila, Tricha Anjali
FGCN
2008
IEEE
335views Communications» more  FGCN 2008»
16 years 1 months ago
Barycentric Location Estimation for Indoors Localization in Opportunistic Wireless Networks
The localization requirements for mobile nodes in wireless (sensor) networks are increasing. However, most research works are based on range measurements between nodes which are o...
GuoDong Kang, Tanguy Pérennou, Michel Diaz