This paper discusses the use of networks-on-chip (NoCs) consisting of multiple voltage-frequency islands to cope with power consumption, clock distribution and parameter variation...
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
Soft errors, once only of concern in memories, are beginning to affect logic as well. Determining the soft error rate (SER) of a combinational circuit involves three main masking ...
The success of kernel methods including support vector machines (SVMs) strongly depends on the design of appropriate kernels. While initially kernels were designed in order to han...
The problem of obtaining the maximum a posteriori (map) estimate of a discrete random field is of fundamental importance in many areas of Computer Science. In this work, we build ...