6650 search results - page 1033 / 1330 » models 2009 |
205
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
—Verification is a major issue in circuit and system design. Formal methods like bounded model checking (BMC) can guarantee a high quality of the verification. There are severa...
166
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
The single stuck-at fault coverage is often seen as a figure-of-merit also for scan testing according to other fault models like transition faults, bridging faults, crosstalk faul...
167
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
—We present an embedded software application for the real-time estimation of building occupancy using a network of video cameras. We analyze a series of alternative decomposition...
158
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
—Today, many chips are designed with predefined discrete cell libraries. In this paper we present a new fast gate sizing algorithm that works natively with discrete cell choices...
159
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
RTOS Simulation Henning Zabel, Wolfgang Mueller Universität Paderborn, C-LAB Fürstenallee 11, D-33102 Paderborn, Germany —Today, mobile and embedded real-time systems have to c...