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154
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
Shallow trench isolation (STI) is the mainstream CMOS isolation technology. It uses chemical mechanical planarization (CMP) to remove excess of deposited oxide and attain a planar...
214
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
Enumeration of bounded size cuts is an important step in several logic synthesis algorithms such as technology mapping and re-writing. The standard algorithm does not scale beyond...
196
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
189
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
High power consumption will shorten battery life for handheld devices and cause thermal and reliability problems. One way to lower the dynamic power consumption is to reduce the s...
197
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
Temperature monitoring using thermal sensors is an essential tool for evaluating the thermal behavior and sustaining the reliable operation in high-performance and high-power syst...