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ITC
1998
IEEE
60views Hardware» more  ITC 1998»
15 years 11 months ago
Semiconductor manufacturing process monitoring using built-in self-test for embedded memories
Ivo Schanstra, Dharmajaya Lukita, A. J. van de Goo...
METRICS
1998
IEEE
15 years 11 months ago
Cost Implications of Interrater Agreement for Software Process Assessments
Khaled El Emam, Jean-Martin Simon, Sonia Rousseau,...
MICRO
1998
IEEE
93views Hardware» more  MICRO 1998»
15 years 11 months ago
The YAGS Branch Prediction Scheme
The importance of an accurate branch prediction mechanism has been well documented. Since the
A. N. Eden, Trevor N. Mudge
NDSS
1998
IEEE
15 years 11 months ago
Automated Recovery in a Secure Bootstrap Process
William A. Arbaugh, Angelos D. Keromytis, David J....