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ITC
1998
IEEE
79views Hardware» more  ITC 1998»
15 years 11 months ago
An almost full-scan BIST solution-higher fault coverage and shorter test application time
Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng
LCN
1998
IEEE
15 years 11 months ago
Optical Logic Circuits: A New Approach to the Control of Fiber Optic LANs
Georgios I. Papadimitriou, Amalia N. Miliou, Andre...
LCN
1998
IEEE
15 years 11 months ago
ATM Networks
Tetsuya Yokotani, K. Murakami, Tatsuki Ichihashi, ...
152
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LICS
1998
IEEE
15 years 11 months ago
A Theory of Recursive Domains with Applications to Concurrency
Gian Luca Cattani, Marcelo P. Fiore, Glynn Winskel
METRICS
1998
IEEE
15 years 11 months ago
Experimenting with Error Abstraction in Requirements Documents
Filippo Lanubile, Forrest Shull, Victor R. Basili