Sciweavers

8949 search results - page 1607 / 1790
» is 1998
Sort
View
TCAD
1998
96views more  TCAD 1998»
15 years 6 months ago
Diagnosis of clustered faults and wafer testing
—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thula...
TCAD
1998
95views more  TCAD 1998»
15 years 6 months ago
A framework for comparing models of computation
—We give a denotational framework (a “meta model”) within which certain properties of models of computation can be compared. It describes concurrent processes in general term...
Edward A. Lee, Alberto L. Sangiovanni-Vincentelli
TCAD
1998
125views more  TCAD 1998»
15 years 6 months ago
Test-point insertion: scan paths through functional logic
—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Kwang-T...
TCAD
1998
91views more  TCAD 1998»
15 years 6 months ago
Cost-free scan: a low-overhead scan path design
Conventional scan design imposes considerable area and delay overhead by using larger scan ip- ops and additional scan wires without utilizing the functionality of the combinatio...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Mike Ti...
TCAD
1998
115views more  TCAD 1998»
15 years 6 months ago
Probabilistic modeling of dependencies during switching activity analysis
—This paper addresses, from a probabilistic point of view, the issue of switching activity estimation in combinational circuits under the zero-delay model. As the main theoretica...
Radu Marculescu, Diana Marculescu, Massoud Pedram
« Prev « First page 1607 / 1790 Last » Next »