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177
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
157
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
— We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theo...
153
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DIAL
2006
IEEE
16 years 25 days ago
2006
IEEE
It is an important topic for segmentation on how to merge the over-segmented subimages of characters into integral characters. The conventional character segmentation has been mos...
163
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DSN
2006
IEEE
16 years 25 days ago
2006
IEEE
This work presents a failure data analysis campaign on Bluetooth Personal Area Networks (PANs) conducted on two kind of heterogeneous testbeds (working for more than one year). Th...
189
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ECRTS
2006
IEEE
16 years 25 days ago
2006
IEEE
FlexRay will very likely become the de-facto standard for in-vehicle communications. However, before it can be successfully used for safety-critical applications that require pred...