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143
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
The ever increasing usage of microprocessor devices is sustained by a high volume production that in turn requires a high production yield, backed by a controlled process. Fault d...
112
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
In recent years, Assertion-Based Verification is being widely accepted as a key technology in the pre-silicon validation of system-on-chip(SOC) designs. The System Verilog langua...
188
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
We present a coverage metric which evaluates the testing of a set of interacting concurrent processes. Existing behavioral coverage metrics focus almost exclusively on the testing...
190
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
126
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DATE
2006
IEEE
16 years 25 days ago
2006
IEEE
We report the first fully integrated single photon avalanche diode array fabricated in 0.35µm CMOS technology. At 25µm, the pixel pitch achieved by this design is the smallest e...