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    DT
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    Defect Tolerance for Nanoscale Crossbar-Based Devices
    15 years 6 months ago
    Defect Tolerance for Nanoscale Crossbar-Based Devices
    Download  www.engr.uconn.edu
    Mohammad Tehranipoor, Reza M. Rad
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    DT
    2008
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    Challenges and Solutions for Late- and Post-Silicon Design
    15 years 6 months ago
    Challenges and Solutions for Late- and Post-Silicon Design
    Download  bwrc.eecs.berkeley.edu
    Jan M. Rabaey, Sharad Malik
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    DT
    2008
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    UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting
    15 years 6 months ago
    UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting
    Download  larc.ee.nthu.edu.tw
    Chao-Wen Tzeng, Shi-Yu Huang
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    DT
    2008
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    A Quality-Driven Design Approach for NoCs
    15 years 6 months ago
    A Quality-Driven Design Approach for NoCs
    Download  www.iml.ece.mcgill.ca
    Stephan Bourduas, Jean-Samuel Chenard, Zeljko Zili...
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    A Digital-Microfluidic Approach to Chip Cooling
    15 years 6 months ago
    A Digital-Microfluidic Approach to Chip Cooling
    Download  people.ee.duke.edu
    Philip Y. Paik, Vamsee K. Pamula, Krishnendu Chakr...
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