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DELTA
2008
IEEE
16 years 1 months ago
AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre
DEPCOS
2008
IEEE
96views Hardware» more  DEPCOS 2008»
16 years 1 months ago
Standards Conformity Framework in Comparison with Contemporary Methods Supporting Standards Application
Achieving and assessing conformity with standards and compliance with various sets of requirements generates significant costs for contemporary economies. Great deal of this is sp...
Lukasz Cyra, Janusz Górski
DSD
2008
IEEE
85views Hardware» more  DSD 2008»
16 years 1 months ago
TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
Josef Strnadel
ECBS
2008
IEEE
121views Hardware» more  ECBS 2008»
16 years 1 months ago
Agile Release Planning: Dealing with Uncertainty in Development Time and Business Value
Release planning is a critical activity in the software development process. The creation of a clear and realistic plan is extremely difficult, as key factors such as time and cos...
Kevin Logue, Kevin McDaid
ETFA
2008
IEEE
16 years 1 months ago
Optimal on-line (m, k)-firm constraint assignment for real-time control tasks based on plant state information
1 In this paper, we study the problem of scheduling a set of control tasks. We distinguish three different situations of states of controlled plants: not activated, steady state si...
Felicioni Flavia, Jia Ning, Françoise Simon...