1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
During semiconductor manufacturing, particles undesirably depose on the surface of the wafer causing “open” and “short” defects to interconnects. In this paper, a third ty...
The network-on-chip (NoC) paradigm is seen as a way of facilitating the integration of a large number of computational and storage blocks on a chip to meet several performance and...
Synchronous circuits are typically clocked considering worst case timing paths so that timing errors are avoided under all circumstances. In the case of a pipelined processor, thi...
Viswanathan Subramanian, Mikel Bezdek, Naga Durga ...
This paper investigates resource allocation policies for achieving real-time content distribution with subsecond delay bounds on the current Internet. Resource allocation in real-...