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165
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VLSID
2008
IEEE
16 years 7 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
171
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IROS
2008
IEEE
16 years 1 months ago
2008
IEEE
— Skin is an essential component of artificial hands. It enables the use of object affordance for recognition and control, but due to its intrinsic locality and low density of c...
166
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LICS
2008
IEEE
16 years 1 months ago
2008
IEEE
We study the classes of B¨uchi and Rabin automatic structures. For B¨uchi (Rabin) automatic structures their domains consist of infinite strings (trees), and the basic relation...
167
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LICS
2008
IEEE
16 years 1 months ago
2008
IEEE
We propose a setting in which the search for a proof of B or a refutation of B (a proof of ¬B) can be carried out simultaneously: this is in contrast to the usual approach in aut...
192
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LICS
2008
IEEE
16 years 1 months ago
2008
IEEE
Kleene algebra with tests (KAT) is an equational system for program verification that combines Kleene algebra (KA), or the algebra of regular expressions, with Boolean algebra. I...