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VLSID
2006
IEEE
16 years 7 months ago
2006
IEEE
For a nanoCMOS of sub-65nm technology, where the gate oxide (SiO2) thickness is very low, the gate leakage is one of the major components of power dissipation. In this paper, we pr...
181
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VLSID
2006
IEEE
16 years 7 months ago
2006
IEEE
Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
217
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VLSID
2006
IEEE
16 years 7 months ago
2006
IEEE
The two dominant architectural choices for implementing efficient communication fabrics for SoC's have been transaction-based buses and packet-based Networks-onChip (NoC). Bo...
214
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3DPVT
2006
IEEE
16 years 1 months ago
2006
IEEE
Interactive network-based navigation over large urban environments raises difficult problems due to the size and complexity of these scenes. In this paper, we present a clientser...
179
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3DPVT
2006
IEEE
16 years 1 months ago
2006
IEEE
We introduce a new method for filling holes in geometry obtained from 3D range scanners. Our method makes use of 2D images of the areas where geometric data is missing. The 2D im...