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DSN
2002
IEEE
15 years 11 months ago
SMART: Stochastic Model-checking Analyzer for Reliability and Timing
Gianfranco Ciardo, R. L. Jones III, Robert M. Marm...
DSN
2002
IEEE
15 years 11 months ago
An Experimental Evaluation of the REE SIFT Environment for Spaceborne Applications
Keith Whisnant, Ravishankar K. Iyer, P. Jones, Rap...
FOCS
2002
IEEE
15 years 11 months ago
Power from Random Strings
Eric Allender, Harry Buhrman, Michal Koucký...
HAPTICS
2002
IEEE
15 years 11 months ago
Validating a Novel Approach to Rendering Fingertip Contact Sensations
Mark A. Salada, J. Edward Colgate, Margaret V. Lee...
ICNP
2002
IEEE
15 years 11 months ago
A Formal Approach for Passive Testing of Protocol Data Portions
David Lee, Dongluo Chen, Ruibing Hao, Raymond E. M...