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156
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
155
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
—Increasing power density causes die overheating due to limited cooling capacity of the package. Conventional thermal management techniques e.g. logic shutdown, clock gating, fre...
158
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
: - The rising complexity of modern embedded systems is causing a significant increase in the verification effort required by hardware designers and software developers, leading to...
160
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
Field Programmable Gate Arrays (FPGAs) are important hardware platforms in various applications due to increasing design complexity and mask costs. However, as CMOS process techno...
168
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...