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KDD
2004
ACM
190views Data Mining» more  KDD 2004»
16 years 7 months ago
Kernel k-means: spectral clustering and normalized cuts
Kernel k-means and spectral clustering have both been used to identify clusters that are non-linearly separable in input space. Despite significant research, these methods have re...
Inderjit S. Dhillon, Yuqiang Guan, Brian Kulis
KDD
2004
ACM
207views Data Mining» more  KDD 2004»
16 years 7 months ago
SPIN: mining maximal frequent subgraphs from graph databases
One fundamental challenge for mining recurring subgraphs from semi-structured data sets is the overwhelming abundance of such patterns. In large graph databases, the total number ...
Jun Huan, Wei Wang 0010, Jan Prins, Jiong Yang
VLSID
2004
IEEE
139views VLSI» more  VLSID 2004»
16 years 7 months ago
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
André Ivanov, Baosheng Wang, Josh Yang
HPCA
2004
IEEE
16 years 7 months ago
Reducing Branch Misprediction Penalty via Selective Branch Recovery
Branch misprediction penalty consists of two components: the time wasted on mis-speculative execution until the mispredicted branch is resolved and the time to restart the pipelin...
Amit Gandhi, Haitham Akkary, Srikanth T. Srinivasa...
CHI
2004
ACM
16 years 7 months ago
Multiblending: displaying overlapping windows simultaneously without the drawbacks of alpha blending
Alpha blending allows the simultaneous display of overlapping windows--such as palette windows in visual workspaces. Although alpha blending has been used in some applications, su...
Patrick Baudisch, Carl Gutwin