—We propose a multi-layer parallel decoding algorithm and VLSI architecture for decoding of structured quasi-cyclic low-density parity-check codes. In the conventional layered de...
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
Taniya Siddiqua, Sudhanva Gurumurthi, Mircea R. St...
The extent to which the 6T SRAM bit cell can be perpetuated through continued scaling is of enormous technological and economic importance. Understanding the growing limitations i...
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
—In this work we study the problem of query privacy in large scale sensor networks. Motivated by a novel trust model in which clients query networks owned by trusted entities but...