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178
Voted
DAC
2005
ACM
15 years 8 months ago
Smart diagnostics for configurable processor verification
This paper describes a novel technique called Embedded Test-bench Control (ETC), extensively used in the verification of Tensilica’s latest configurable processor. Conventional ...
Sadik Ezer, Scott Johnson
189
Voted
DAC
2005
ACM
15 years 8 months ago
Total power reduction in CMOS circuits via gate sizing and multiple threshold voltages
Minimizing power consumption is one of the most important objectives in IC design. Resizing gates and assigning different Vt’s are common ways to meet power and timing budgets. ...
Feng Gao, John P. Hayes
164
Voted
DAC
2005
ACM
15 years 8 months ago
Path delay test compaction with process variation tolerance
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, T...
185
Voted
DAC
2005
ACM
15 years 8 months ago
Minimizing peak current via opposite-phase clock tree
Although a lot of research efforts have been made in the minimization of the total power consumption caused by the clock tree, no attention has been paid to the minimization of th...
Yow-Tyng Nieh, Shih-Hsu Huang, Sheng-Yu Hsu
175
Voted
DAC
2005
ACM
15 years 8 months ago
Sign bit reduction encoding for low power applications
This paper proposes a low power technique, called SBR (Sign Bit Reduction) which may reduce the switching activity in multipliers as well as data buses. Utilizing the multipliers ...
M. Saneei, Ali Afzali-Kusha, Zainalabedin Navabi
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