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AINA
2010
IEEE
15 years 12 months ago
2010
IEEE
Abstract—We describe a Bayesian formalism for the intelligent selection of observations from sensor networks that may intermittently undergo faults or changepoints. Such active d...
208
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DATE
2010
IEEE
15 years 12 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
198
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DATE
2010
IEEE
15 years 12 months ago
2010
IEEE
—In order to solve the challenges in processor design for the next generation wireless communication systems, this paper first proposes a system level design flow for communicati...
190
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DATE
2010
IEEE
15 years 12 months ago
2010
IEEE
—We present a new technique for statistical static timing analysis (SSTA) based on Markov chain Monte Carlo (MCMC), that allows fast and accurate estimation of the right-hand tai...
140
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DATE
2010
IEEE
15 years 12 months ago
2010
IEEE
—Design-time application mapping is limited to a predefined set of applications and a static platform. Resource management at run-time is required to handle future changes in th...