During concurrent I/O workloads, sequential access to one I/O stream can be interrupted by accesses to other streams in the system. Frequent switching between multiple sequential ...
Chuanpeng Li, Kai Shen, Athanasios E. Papathanasio...
As CMOS feature sizes venture deep into the nanometer regime, wearout mechanisms including negative-bias temperature instability and timedependent dielectric breakdown can severely...
Shuguang Feng, Shantanu Gupta, Amin Ansari, Scott ...
— Energy efficiency has become one of the most important issues to be addressed in today’s System-on-a-Chip (SoC) designs. One way to lower the power consumption is to reduce ...
High power consumption will shorten battery life for handheld devices and cause thermal and reliability problems. One way to lower the dynamic power consumption is to reduce the s...
Royce L. S. Ching, Evangeline F. Y. Young, Kevin C...
— Cycle-accurate functional descriptions (CAFDs) are being widely adopted in integrated circuit (IC) design flows. Power estimation can potentially benefit from the inherent in...
Lin Zhong, Srivaths Ravi, Anand Raghunathan, Niraj...