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188
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MEMICS
2010
15 years 1 months ago
2010
Abstract. Increasing integration densities and the emergence of nanotechnology cause issues related to reliability and power consumption to become dominant factors for the design o...
208
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CBSE
2011
Springer
14 years 6 months ago
2011
Springer
Automating the construction of secure distributed systems becomes necessary. Indeed, developing security code requires a deep expertise and verifying that the developed code respe...
183
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INFOCOM
2012
IEEE
13 years 9 months ago
2012
IEEE
—The opening of under-utilized spectrum creates the opportunity of substantial performance improvement through cognitive radio techniques. However, the real network performance m...
171
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HPCA
2009
IEEE
16 years 7 months ago
2009
IEEE
This paper presents elastic buffers (EBs), an efficient flow-control scheme that uses the storage already present in pipelined channels in place of explicit input virtualchannel b...
154
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ISQED
2010
IEEE
16 years 1 months ago
2010
IEEE
—Negative Bias Temperature Instability (NBTI) is one of the major reliability problems in advanced technologies. NBTI causes threshold voltage degradation in a PMOS transistor wh...