Sciweavers

1555 search results - page 206 / 311
» When the implication is not to design (technology)
Sort
View
ISCAS
2007
IEEE
173views Hardware» more  ISCAS 2007»
16 years 22 days ago
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
LION
2007
Springer
113views Optimization» more  LION 2007»
16 years 17 days ago
Limited-Memory Techniques for Sensor Placement in Water Distribution Networks
Abstract. The practical utility of optimization technologies is often impacted by factors that reflect how these tools are used in practice, including whether various real-world c...
William E. Hart, Jonathan W. Berry, Erik G. Boman,...
MTSR
2007
Springer
16 years 17 days ago
Quality Metrics in Learning Objects
In today's rapidly evolving society, the range and depth of information available to us is quickly growing which affects educational institutions, who find it difficult to kee...
Juan F. Cervera, María G. López-L&oa...
OTM
2007
Springer
16 years 17 days ago
Trust Management Model and Architecture for Context-Aware Service Platforms
The entities participating in a context-aware service platform need to establish and manage trust relationships in order to assert different trust aspects including identity provis...
Ricardo Neisse, Maarten Wegdam, Marten van Sindere...
ASPDAC
2006
ACM
135views Hardware» more  ASPDAC 2006»
16 years 12 days ago
Robust analytical gate delay modeling for low voltage circuits
— Sakurai-Newton (SN) delay metric [1] is a widely used closed form delay metric for CMOS gates because of simplicity and reasonable accuracy. Nevertheless it can be shown that t...
Anand Ramalingam, Sreekumar V. Kodakara, Anirudh D...