: This paper argues about the utility of advanced knowledge-based techniques to develop web-based applications that help consumers in finding products within marketplaces in e-comm...
We present a new pseudorandom testing algorithm for the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are...
In this paper, we give an overview of the trade-off to improve yield and optimize silicon manufacturing cost. The specific technology focus is on large embedded memories in comple...
Abstract. Users need know nothing of the internals of distributed applications that are performing well. However, when performance flags or fails, a depiction of system behavior f...
We describe two techniques for fast multiple-precision evaluation of linearly convergent series, including power series and Ramanujan series. The computation time for N bits is O(...