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SDM
2009
SIAM
112views Data Mining» more  SDM 2009»
16 years 3 months ago
A Re-evaluation of the Over-Searching Phenomenon in Inductive Rule Learning.
Most commonly used inductive rule learning algorithms employ a hill-climbing search, whereas local pattern discovery algorithms employ exhaustive search. In this paper, we evaluat...
Frederik Janssen, Johannes Fürnkranz
ICCD
2008
IEEE
117views Hardware» more  ICCD 2008»
16 years 3 months ago
RMA: A Read Miss-Based Spin-Down Algorithm using an NV cache
—It is an important issue to reduce the power consumption of a hard disk that takes a large amount of computer system’s power. As a new trend, an NV cache is used to make a dis...
Hyotaek Shim, Jaegeuk Kim, Dawoon Jung, Jin-Soo Ki...
ICCD
2007
IEEE
125views Hardware» more  ICCD 2007»
16 years 3 months ago
Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz
ICCD
2006
IEEE
95views Hardware» more  ICCD 2006»
16 years 3 months ago
Scale in Chip Interconnect requires Network Technology
— Continued scaling of CMOS has lead to a problem of scale as gates are faster than light travelling across a chip. Scalability used to be the hallmark of CMOS. Half the size, do...
Enno Wein
ICCD
2003
IEEE
130views Hardware» more  ICCD 2003»
16 years 3 months ago
On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume
This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or fr...
Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Cha...