1093 search results - page 158 / 219 » Verifying VLSI Circuits |
147
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ISPD
2004
ACM
15 years 11 months ago
2004
ACM
Due to increasing design complexity, routing congestion has become a critical problem in VLSI designs. This paper introduces a distributed metric to predict routing congestion for...
153
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DFT
2003
IEEE
15 years 11 months ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
172
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DFT
2003
IEEE
15 years 11 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
158
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IPPS
2003
IEEE
15 years 11 months ago
2003
IEEE
In this paper, we discuss a parallel tabu search algorithm with implementation in a heterogeneous environment. Two parallelization strategies are integrated: functional decomposit...
168
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ISVLSI
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...