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ITC
2003
IEEE
126views Hardware» more  ITC 2003»
16 years 13 hour ago
Deformations of IC Structure in Test and Yield Learning
This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...
Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Tho...
WSC
2008
15 years 9 months ago
Comparing two systems: Beyond common random numbers
Suppose one wishes to compare two closely related systems via stochastic simulation. Common random numbers (CRN) involves using the same streams of uniform random variates as inpu...
Samuel Ehrlichman, Shane G. Henderson
CVPR
2005
IEEE
16 years 8 months ago
Polarization Multiplexing for Bidirectional Imaging
Our goal is to incorporate polarization in appearancebased modeling in an efficient and meaningful way. Polarization has been used in numerous prior studies for separating diffuse...
Oana G. Cula, Kristin J. Dana, Dinesh K. Pai, Dong...
SMA
2009
ACM
130views Solid Modeling» more  SMA 2009»
16 years 1 months ago
A symbolic-numerical envelope algorithm using quadratic MOS patches
In this paper, we describe an algorithm for generating an exact rational envelope of a two-parameter family of spheres given by a quadratic patch in R3,1 , which is considered as ...
Bohumír Bastl, Jirí Kosinka, Mirosla...
180
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ACCV
2007
Springer
16 years 28 days ago
User-Guided Shape from Shading to Reconstruct Fine Details from a Single Photograph
Abstract. Many real objects, such as faces, sculptures, or low-reliefs are composed of many detailed parts that can not be easily modeled by an artist nor by 3D scanning. In this p...
Alexandre Meyer, Héctor M. Briceño, ...