This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...
Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Tho...
Suppose one wishes to compare two closely related systems via stochastic simulation. Common random numbers (CRN) involves using the same streams of uniform random variates as inpu...
Our goal is to incorporate polarization in appearancebased modeling in an efficient and meaningful way. Polarization has been used in numerous prior studies for separating diffuse...
Oana G. Cula, Kristin J. Dana, Dinesh K. Pai, Dong...
In this paper, we describe an algorithm for generating an exact rational envelope of a two-parameter family of spheres given by a quadratic patch in R3,1 , which is considered as ...
Abstract. Many real objects, such as faces, sculptures, or low-reliefs are composed of many detailed parts that can not be easily modeled by an artist nor by 3D scanning. In this p...